Modeling a two-level risk reduction of an enterprise in the formation of staff competence

An analysis of the possibility of modeling the risk reduction of an enterprise in the formation of the competence of management personnel, based on fundamental research by leading scientists, was carried out. It is shown that at the enterprise it is possible to distinguish different levels of activity associated with risks in the formation of personnel competencies (current management activities and training of specialists). It is concluded that the modeling of two-level risk reduction can be classified as a non-linear stochastic programming problem due to the clearly non-linear relationships between the model variables and the probabilistic optimality criterion

Quality and risk management at real economy enterprises

The analysis of risk management based on fundamental research by leading scientists has been carried out. It is shown that personnel risk management is a process that begins at the stage of developing a personnel management strategy and covers the entire personnel management system of an organization at all its levels. It is concluded that enterprises in the real sector of the economy should focus on the formation of the competencies of their personnel, since not one of the stages in the development of enterprise management systems could do without new knowledge, without new competencies

The Impact of ESD on Microcontrollers

M odern m ethods and means of testing the stability of microcontrollers to the effects of electrostatic discharges are considered. The analysis of functional and operational characteristics of microcontrollers with a program code written in the built-in flash memory is performed. A damage mechanisms classifi­ cation to m icrocontrollers after the influence of electrostatic discharge and the possibility of developing new algorithms for technical diagnostics of microcontrollers are proposed. O n the basis of thermal processes analysis occurring in current-carrying elements of integrated cir­ cuits, the dependence of temperature, electric field strength and power of electromagnetic losses in each element and in their contact areas is shown, depending on the electrostatic discharge voltage. It is shown that electrostatic discharge affects change in programmed data in microcontrollers. The m ethod of functional control of microcontrollers, after exposure to static electricity discharges, developed by the authors is described; this m ethod makes it possible to improve the result of culling of potentially unreliable products by obtaining information about possible violations in the built-in flash memory of microcircuits. The monograph is intended for scientists, engineers, graduate students and undergraduates working in the field of integrated circuits reliability assessment. It can be used by senior courses students of rele­ vant specialties